Measure the reflectivity of the target film, accurately measure the film thickness and optical constants! Non contact, Non destructive, Microscopic

The measurement time is only 1 second!

The OPTM series spectrophotometer uses microscopic spectroscopy to measure reflectance in small areas, allowing for high-precision analysis of film thickness/optical constants. Measure the thickness of coatings through non-destructive and non-contact methods, such as various films, chips, optical materials, and multilayer films. In terms of measurement time, it can achieve high-speed measurement of 1 second per point, and is equipped with software that can easily analyze optical constants even for first-time users

Product features:

• The head integrates the necessary functions for measuring film thickness

• Measurement of high-precision reflectance (multilayer film thickness, optical constants) using microspectroscopy

• 1:1 high-speed measurement

• Optical system with wide range under microscopic spectroscopy (UV * * * near-infrared)

• Security mechanism of regional sensors

• Easy to analyze guide, beginners can also perform optical constant analysis

• Independent measuring heads correspond to various inline customization requirements

• Support various customizations

Measurement items:

• **Reflectance measurement

• Analysis of multilayer films

• Optical constant analysis (n: refractive index, k: extinction coefficient)

Application:

• Semiconductor: automatic adjustment of wafer samples, wafer bending detection

• Optical components: detection of emissivity, bending, and other parameters of lens lenses

Product specifications and models：